Products

High Temperature Resistant Potting Adhesive Electronic/EL Grade

    • Product Name: High Temperature Resistant Potting Adhesive Electronic/EL Grade
    • Factroy Site: Yudu County, Ganzhou, Jiangxi, China
    • Price Inquiry: admin@ascent-chem.com
    • Manufacturer: Ascent Petrochem Holdings Co., Limited
    • CONTACT NOW
    Specifications
    HS Code 415409
    Heat Resistance Temperature 180°C continuous, 200°C intermittent
    Dielectric Strength 18 kV/mm
    Volume Resistivity 1.0×10^14 Ω·cm
    Thermal Conductivity 0.8 W/m·K
    Operating Temperature Range -40°C to +180°C
    Viscosity At 25c 2500 mPa·s
    Curing Time At 120c 30 minutes
    Glass Transition Temperature 150°C
    Hardness Shore D 75
    Adhesion To Substrates Excellent on aluminum, copper, FR-4, ceramic, and glass
    Coefficient Of Thermal Expansion 55 ppm/°C below Tg
    Chemical Resistance Resistant to solvents, moisture, mild acids, and alkalis

    As an accredited High Temperature Resistant Potting Adhesive Electronic/EL Grade factory, we enforce strict quality protocols—every batch undergoes rigorous testing to ensure consistent efficacy and safety standards.

    Packing & Storage
    Packing Supplied in 1 kg sealed aluminum bottles with safety labels, ensuring moisture resistance and safe handling for electronic potting applications.
    Container Loading (20′ FCL) 20′ FCL: sealed container loading of electronic-grade heat-resistant potting adhesive, safely packed, ventilated, protected from moisture and heat.
    Shipping Ships via ground freight only due to chemical classification. Standard packaging is sealed pails or cartridges, cushioned to prevent leakage or damage. Avoid air transport and extreme heat during transit. Delivery requires adult signature. Please review SDS for handling and disposal instructions before receipt.
    Storage Store in a tightly sealed original container in a cool, dry, well-ventilated area away from direct sunlight and heat sources. Recommended temperature: 5–25°C (41–77°F). Keep away from moisture, oxidizers, and incompatible materials. Use within manufacturer’s stated shelf life, typically six to twelve months.
    Shelf Life Shelf life is typically 6 months from manufacture date when stored unopened in a cool, dry place below 25°C.
    Application of High Temperature Resistant Potting Adhesive Electronic/EL Grade

    In a 1,200 V SiC half-bridge module assembled on an AlN direct-bonded copper substrate, the encapsulant is dispensed at a cavity temperature of 70 °C under a chamber pressure of 5 mbar to 10 mbar after the resin component has been degassed at 25 °C for 15 min. The mixed system typically exhibits a viscosity of 2,500 mPa·s to 5,000 mPa·s at 25 °C when measured on a Brookfield RV spindle #6 at 20 rpm, and a pot life of 3 h to 6 h at 25 °C. Filler settling velocity follows Stokesian behaviour and becomes a process conflict when fused alumina with a median particle size of 5 µm to 10 µm is loaded above 75 wt%; holding the mixed material under vacuum longer than 10 min can produce a sediment layer at the feed line inlet, altering thermal conductivity from 1.2 W/m·K to 0.6 W/m·K in the dispensed shot. The cured compound is evaluated under UL 746B for relative thermal index, with high-temperature electronic/EL grades typically requiring an RTI of 180 °C to 200 °C, and flame retardancy is verified to UL 94 V-0 at 3.0 mm thickness. Stage curing is set at 90 °C for 1 h, then 150 °C for 2 h, then 175 °C for 1 h, because a single-step cure above 150 °C can produce an internal exotherm greater than 220 °C in a shot mass above 50 g, leading to cracked corners and wire-bond lift on 250 µm aluminium wires. Thermal shock per IEC 60068-2-14 Test Na from -55 °C to 175 °C for 500 cycles is commonly used as an acceptance test, with delamination measured by scanning acoustic microscope and allowed only below 1 mm from the DBC edge. The CTE of the cured compound below its glass transition temperature is targeted at 25 ppm/°C to 30 ppm/°C by thermomechanical analysis per ISO 11359-2, which is sufficiently close to the 17 ppm/°C expansion of copper and 4.5 ppm/°C expansion of AlN to reduce tensile stress at wire-bond interfaces but still requires alumina levels near 70 wt%, at which point vacuum infiltration under large-area chips becomes sensitive to die attach voiding.

    StandardTest conditionAcceptance criterion
    UL 9420 mm vertical burnV-0 at 3.0 mm
    UL 746BLong-term heat ageingRTI ≥ 180 °C
    IEC 60068-2-14 Test Na-55 °C to 175 °C500 cycles, delamination < 1 mm from edge
    ASTM D257500 V DCVolume resistivity ≥ 1×10^14 Ω·cm
    ASTM D547025 °C guarded heat flowThermal conductivity 1.0–1.5 W/m·K
    IEC 6027060 HzPDIV > 1.5 kV at 1 mm

    Can On-Board Charger Potting Compounds Survive 85°C/85% RH Biased Humidity Without Delamination?

    An 11 kW on-board charger housed in a die-cast aluminium enclosure is potted after the power board is mounted at a 6 mm standoff from the base plate, leaving a 12 mm maximum fill depth over TO-247 switching devices. The two-part epoxy is metered through a 2K meter-mix dispenser with a 24-element static mixer at 40 °C to reduce mixed viscosity to below 1,200 mPa·s, then the filled housing is transferred to a vacuum chamber at 20 mbar for 3 min to extract air from beneath surface-mount inductors and gate-drive transformers. The main process conflict is outgassing of the anodised aluminium base plate: residual sealing solution in the anodised pores can expand under vacuum and produce 50 µm to 150 µm bubbles at the metal interface, so production lines commonly pre-bake the enclosure at 120 °C for 2 h when relative humidity exceeds 60%. Curing is performed at 85 °C for 1 h followed by 150 °C for 2 h. The cured material must pass biased humidity ageing at 85 °C/85% RH for 1,000 h with a 100 V DC bias applied across a 0.5 mm gap, and insulation resistance must remain above 1 GΩ when measured at 500 V DC per IPC-TM-650 method 3.5.1. Thermal cycling per ISO 16750-4:2010 from -40 °C to 150 °C for 1,000 cycles is the reference acceptance sequence for under-hood electronics; the failure criterion is a shift in capacitance of Y-capacitors of more than 5% or visible delamination at the FR-4/aluminium interface. The glass transition temperature after post-cure is typically 165 °C to 185 °C by differential scanning calorimetry per ISO 11357-2, and the coefficient of thermal expansion below Tg is held near 35 ppm/°C to avoid cracking of ceramic capacitors. Lap shear adhesion to anodised aluminium is measured per ASTM D1002 and should exceed 2.5 N/mm² after ageing; values below 1.5 N/mm² correlate with field failures at the seal groove. For high-voltage potting in OBC circuits, an IEC 60664-1 creepage distance of 6.3 mm is maintained by the encapsulant thickness over the switching node, and the material must show a comparative tracking index above 600 V per IEC 60112 to avoid carbon track formation under polluted conditions.

    Because electroluminescent lamp drivers produce sinusoidal outputs from 110 V to 220 V at frequencies between 400 Hz and 4,000 Hz, the potting compound around the step-up transformer and MOSFET drain nodes is subjected to partial discharge stress rather than simple dielectric breakdown. The EL-grade encapsulant is formulated with extractable chloride content below 5 ppm, sodium below 3 ppm, and ammonium below 5 ppm by ion chromatography after aqueous extraction per IPC-TM-650 method 2.3.28; early field failures in EL power supplies were traced to electrochemical migration across 0.2 mm conductor gaps when chloride concentrations exceeded 15 ppm under 85 °C/85% RH bias. The mixed system is supplied at 800 mPa·s to 1,500 mPa·s to permit flow into 0.4 mm gaps around toroidal ferrite cores without breaking 0.1 mm polyester-insulated wire. Vacuum degassing is performed at 1 mbar until foam collapses, normally within 2 min; holding under vacuum longer than 5 min can strip reactive diluent and shift the gel time from 45 min to 60 min. The cure schedule of 85 °C for 30 min followed by 125 °C for 1 h limits peak exotherm to 145 °C, which is below the thermal shrinkage threshold of polyester film dielectric in EL lamps. Partial discharge inception voltage measured per IEC 60270 on a 1 mm gap is required above 1.8 kV at 60 Hz, and the extinction voltage is required above 1.5 kV to prevent sustained discharges after a transient overvoltage. Volume resistivity after 7 days at 85 °C/85% RH is measured at 500 V DC per ASTM D257 and must remain above 1×10^14 Ω·cm. Bare copper traces require a benzotriazole passivation step or the use of non-amine cure systems, because free amine catalysts dissolve copper and create mobile copper-amine complexes that reduce insulation resistance under bias. The potted EL driver is subjected to a 2-hour burn-in at 85 °C under 120 V AC input to identify latent voids; a 1% loss in minimum luminance is the typical factory acceptance criterion.

    High-Temperature Potting Failure Modes in Measurement-While-Drilling Electronics Above 200°C

    Measurement-while-drilling modules are potted inside stainless steel barrels and are exposed to 175 °C to 220 °C at hydrostatic pressures up to 140 MPa for 500 h to 1,000 h. The dominant failure mode in epoxy systems is not dielectric breakdown but adhesion loss at the polyimide/stainless steel interface, which allows drilling vibration to abrade 0.05 mm magnet wire inside the sensor basket. For high-temperature vacuum potting, the compound is degassed at 5 mbar and 70 °C, then flooded into the sensor annulus; viscosity must remain below 800 mPa·s during the first 10 min to penetrate 0.2 mm varnish gaps between windings. Fumed silica at 2 wt% to 4 wt% is used to produce a yield stress of 15 Pa to 40 Pa on a parallel-plate rheometer, which restricts filler settling during the long flow path while still allowing vacuum impregnation. After cure, the potting compound is aged at 220 °C for 1,000 h in a forced-air oven; hardness retention is measured per ASTM D2240 with a rejection limit of more than 15 Shore A points loss for silicone systems or more than 10 Shore D points loss for rigid epoxies. Outgassing is evaluated per ASTM E595-15; a total mass loss below 1.0% and collected volatile condensable material below 0.1% are required to prevent deposition on downhole optical windows and connector contacts. Thermal conductivity is measured at 200 °C by the guarded heat flow method per ASTM D5470, but published data for exact high-temperature conductivity remain limited; most supplier documentation reports values at 25 °C and 100 °C, so a linear interpolation to 200 °C is not valid without hot-disk or laser-flash verification. The process conflict in silicone potting is platinum catalyst poisoning by sulfur-cured elastomers in cable jackets and O-rings; tooling and fixtures must be verified to be free of sulfur, tin, and amine residues. This application requires a continuous operating temperature rating above 200 °C, which is confirmed by thermogravimetric analysis per ASTM E1131 showing less than 5% weight loss after 100 h at 250 °C in nitrogen.

    Across a transmission speed sensor line, the ferrite core and coil assembly is inserted into a PBT 30% glass-fiber connector body, and the potting compound is dispensed at a shot volume of 0.8 mL to 1.2 mL around the coil to a depth of 4 mm. The material must resist automatic transmission fluid at 150 °C for 3,000 h with hardness change less than 5 Shore D points and volume swell below 3% per ASTM D471. Adhesion to PBT 30% GF is verified by a destructive torque test on the terminal pin; torque retention above 0.3 N·m after oil ageing is required to prevent terminal loosening under connector insertion. Vibration qualification follows ISO 16750-3 with a random vibration profile at 27.8 m/s² RMS for 8 h per axis; the acceptance criterion is no cracking detected by 30× stereomicroscopy and no electrical open longer than 1 µs during the final 30 min of each axis. The high-volume curing requirement creates a process conflict: a snap cure at 150 °C for 3 min provides tack-free surface but leaves residual stress and a reduced degree of conversion; therefore a post-cure at 130 °C for 30 min is used to raise the glass transition temperature beyond 165 °C and to reduce post-mould shrinkage. Needle dispensing equipment with ±2% volumetric accuracy is required because shot volumes below 0.7 mL leave the ferrite end face exposed to oil ingress, while volumes above 1.4 mL overflow into the connector latch recess and create interference during mating. The compound must also withstand hot oil immersion at 150 °C and simultaneous 10 kV electrostatic discharge pulses applied to the signal terminals following ISO 10605; this requires the cured material to maintain a dielectric strength above 15 kV/mm per ASTM D149 after oil exposure. Incompatibility with zinc stearate mould release on PBT connectors is a known adhesion risk; precleaning with a low-pressure plasma source at 50 W for 60 s is used where bond-line delamination occurs at the connector wall.

    When Avionics Potting Must Control Partial Discharge at 15 kPa Ambient Pressure

    Aerospace flyback transformers operating at 15,000 m equivalent altitude are potted under vacuum because the reduced pressure lowers the Paschen minimum for air in trapped voids; a 0.5 mm void becomes a partial discharge site at approximately 500 V peak, and the discharge can erode the potting compound until the transformer fails. Potting under vacuum at 10 mbar absolute is insufficient if the moulded housing outgasses during resin gelation, so polybutylene terephthalate and glass-filled polyamide housings are pre-dried at 120 °C for 4 h and the resin is degassed at 5 mbar for 10 min before filling. The assembled flyback transformer is heated to 60 °C to reduce viscosity to 900 mPa·s and placed in a pressure/vacuum vessel; after resin introduction, the vessel is raised to 2 bar absolute during gelation to collapse residual bubbles below 50 µm diameter. Partial discharge performance is evaluated per ASTM D1868-20 at 15 kPa and 60 Hz; the acceptance threshold is a partial discharge inception voltage above 1,000 V peak for a 2 mm potting thickness. Thermal cycling from -55 °C to 125 °C is performed per RTCA DO-160G Section 4.5.2, with 3 cycles of 2 h dwell at each extreme; delamination after cycling is inspected by C-mode scanning acoustic microscopy and is not acceptable if the void area exceeds 2% of the winding surface. The material must satisfy flammability requirements per UL 94 V-0 at 1.5 mm and toxic gas emission limits for cabin compartments when applicable. A major process incompatibility is platinum-catalysed silicone in contact with sulfur-cured EPDM vacuum chamber seals; sulfur migration poisons the hydrosilylation reaction and produces a permanently tacky surface. Production records for avionics potting must document resin lot, hardener lot, vacuum level, pressure ramp, and oven load to satisfy FAA and EASA part manufacture traceability requirements. The electrical insulation is measured after ageing per ASTM D257 at 500 V DC, and the material must maintain volume resistivity above 1×10^13 Ω·cm at 125 °C at the end of the cycling sequence.

    Catalyst Poisoning and Heat Transfer Limits in Induction Heating Coil Encapsulation

    In induction heating work coils operating at surface temperatures from 150 °C to 220 °C, the encapsulant must dissipate heat without developing hot spots that accelerate thermal oxidation and reduce coil lifetime. A two-part addition-cure silicone with thermal conductivity of 0.8 W/m·K to 1.2 W/m·K via ASTM D5470 is dispensed around the copper winding; flame retardancy per UL 94 V-0 at 6 mm thickness is typical for industrial drives and induction heating power supplies. The mixed system has a pot life of 90 min at 25 °C and cures at 125 °C for 30 min; deep sections above 30 mm require a step cure at 80 °C for 1 h to prevent foaming from moisture absorbed in the copper oxide layer. Solder flux residues containing tin or amine compounds inhibit platinum hydrosilylation and must be removed with isopropanol and lint-free wipes before dispensing; a simple verification is cure response testing by differential scanning calorimetry per ISO 11357-5, where a residual exotherm above 5 J/g after the standard cure indicates partial inhibition. Thermal cycling under IEC 60068-2-14 Test Na from -40 °C to 200 °C for 1,000 cycles is used as an acceptance test, and adhesion loss at the copper interface is measured by pull-off per ASTM D4541 with a minimum requirement of 1.0 MPa after cycling. Published data for exact thermal conductivity at 220 °C are limited; most supplier thermal conductivity values are generated at 25 °C and 100 °C, and extrapolation to continuous operating temperature should be verified by laser flash analysis per ASTM E1461 before a design freeze. The material must also withstand 10 kV transient overvoltage pulses on the coil terminals; dielectric strength is verified per ASTM D149 on a 2 mm cured sheet, with acceptance above 18 kV/mm. In high-frequency induction systems operating at 50 kHz to 100 kHz, dielectric loss becomes a secondary heat source; the dissipation factor is measured per ASTM D150 at 1 MHz and is maintained below 0.02 to limit additional temperature rise. A critical processing boundary is the presence of silicone inhibitor residues on copper from previous RTV gasketing: even 10 ppm of tin-containing condensation catalyst on the substrate can stop the addition-cure reaction at the interface, leaving a gel-like layer that causes immediate bubble formation during thermal cycling.

    Free Quote

    Competitive High Temperature Resistant Potting Adhesive Electronic/EL Grade prices that fit your budget—flexible terms and customized quotes for every order.

    For samples, pricing, or more information, please contact us at +8615365186327 or mail to admin@ascent-chem.com.

    We will respond to you as soon as possible.

    Tel: +8615365186327

    Email: admin@ascent-chem.com

    Inquiry

    Get Free Quote of Ascent Petrochem Holdings Co., Limited

    Flexible payment, competitive price, premium service - Inquire now!

    Certification & Compliance
    More Introduction

    High-temperature resistant potting adhesive for electronic/EL applications is supplied as a two-component, quartz-filled epoxy-anhydride system under the designation HT-EL-200. The resin component is a bisphenol A novolac epoxy with a hydrolyzable chloride content below 50 ppm; the hardener is methylhexahydrophthalic anhydride accelerated with a latent imidazole. At 25 °C the mixed uncured viscosity is 3,200 mPa·s when tested per ASTM D2196, and the pot life for a 250 g mass is 75 min. The standard cure schedule is 2 h at 100 °C followed by 2 h at 150 °C. The cured density is 1.65 g/cm³, Shore D hardness is 88 per ASTM D2240, and tensile elongation is 1.2% at break per ASTM D638. The electronic/EL grade is defined by low extractable ion content, absence of volatile silicone fractions that can deposit on phosphor coatings, and thermal oxidative stability sufficient for encapsulated power modules operating under continuous bias.

    Production dispensing is performed with a two-component meter-mix system fitted with a 24-element disposable static mixer and a needle inner diameter of 0.84 mm. A pressure rise above 250 kPa during steady-state dispensing indicates filler settling or partially gelled material in the static mixer. The mixed adhesive is vacuum-degassed at 5–10 mbar for 5–10 min before potting; prolonged vacuum beyond 10 min can volatilize the latent imidazole accelerator and increase cure onset time. Substrate preheating at 40–60 °C lowers mixed viscosity to approximately 1,500 mPa·s and improves air release from fine-wound coils, but reduces the pot life to less than 35 min and shortens the static mixer residence limit to 90 s at 40 °C.

    What separates electronic/EL-grade high-temperature potting adhesive from general-purpose epoxy compounds?

    The primary difference is ionic cleanliness. HT-EL-200 limits extractable chloride to 18 ppm, extractable sodium to 5 ppm, extractable potassium to 5 ppm, and extractable ammonium to 5 ppm when tested by ion chromatography per IPC-TM-650 method 2.3.25. General-purpose epoxy potting compounds commonly exceed 300 ppm extractable chloride and can promote electrochemical migration under high humidity. The EL-grade formulation also avoids amine hardeners, eliminating amine blush on component leads and reducing risk of corrosion in sealed optoelectronic cavities. Volatile cyclic siloxane content is controlled below 0.1% because contamination of indium tin oxide and phosphor layers in electroluminescent assemblies can occur at higher concentrations.

    Thermal endurance differentiates this product from standard rigid epoxies. The glass transition temperature by thermomechanical analysis is 168 °C, with a tan-delta peak at 181 °C by dynamic mechanical analysis. General-purpose bisphenol A epoxy-amine systems typically exhibit a glass transition between 120 °C and 135 °C. The difference in glass transition governs retention of electrical properties at elevated die temperature. Volume resistivity of HT-EL-200 is 2.8 × 1015 Ω·cm at 25 °C and 1.2 × 1012 Ω·cm at 150 °C per IEC 62631-3-1. Dielectric strength on 2 mm cured plaques is 22 kV/mm at 25 °C and 14 kV/mm at 150 °C per ASTM D149. By comparison, many conventional potting grades retain less than 50% of room-temperature dielectric strength at 130 °C.

    PropertyTest standardHT-EL-200 electronic/EL epoxyGeneral-purpose aromatic epoxy pottingCondensation-cure silicone potting
    Mixed viscosity at 25 °CASTM D21963,200 mPa·s1,200 mPa·s2,500 mPa·s
    Glass transition temperatureASTM E1640168 °C135 °CNot applicable; brittle point -120 °C
    Coefficient of linear thermal expansion below TgASTM E83138 ppm/°C55 ppm/°C300 ppm/°C
    Thermal conductivity at 60 °CASTM D54700.9 W/m·K0.2 W/m·K0.3 W/m·K
    Volume resistivity at 150 °CIEC 62631-3-11.2 × 1012 Ω·cm5.0 × 1010 Ω·cm2.0 × 1014 Ω·cm
    Extractable chlorideIPC-TM-650 2.3.2518 ppm320 ppm5 ppm
    Outgassing total mass lossASTM E5950.35%0.80%0.50%
    Collected volatile condensable materialASTM E5950.08%0.25%0.10%

    Cured-state thermal and electrical performance matrix

    Thermal conductivity measured per ASTM D5470 is 0.9 W/m·K at a mean temperature of 60 °C and 100 N compressive load. The coefficient of linear thermal expansion below glass transition is 38 ppm/°C and above glass transition is 118 ppm/°C per ASTM E831. These values produce a total expansion of approximately 0.55% when heated from 25 °C to 150 °C. Aluminum heat-sink interfaces with a CTE of 23 ppm/°C develop shear stress at the bond line, and for bonding areas larger than 25 cm² a reduced-filler version is used instead of the standard quartz-filled system.

    Electrical stability after humid aging is a critical acceptance criterion for electronic/EL grade use. Surface insulation resistance after 85 °C/85% relative humidity for 1,000 h under 50 V DC is 8.5 × 108 Ω per IPC-TM-650 method 2.6.3.2. Dielectric constant at 1 MHz is 4.0 and dissipation factor is 0.018 per ASTM D150. Comparative tracking index is 600 V per IEC 60112. Arc resistance is 180 s per ASTM D495. The combination of high tracking index and stable high-temperature volume resistivity supports use in DC-DC converter inductors, ignition modules, LED driver housings, and encapsulated power supplies operating at voltages up to 1,000 V DC when void content is below 0.5% by volume.

    Water absorption is 0.2% after 24 h immersion at 25 °C and 0.5% after 48 h boiling water per ASTM D570. Substrates should be pre-dried at 120 °C for 2 h when assembly relative humidity exceeds 60%. If pre-drying is omitted, moisture present on ceramic substrates can vaporize during cure and create voids that reduce dielectric strength by more than 40% in high-voltage modules.

    A 180°C continuous hot-spot rating requires a glass transition margin of at least 25 K

    For mechanically loaded encapsulated assemblies, the continuous operating hot-spot temperature should remain at least 25 K below the glass transition temperature measured by thermomechanical analysis. With a TMA glass transition of 168 °C, the practical continuous mechanical rating is 143 °C. A 180 °C continuous hot-spot rating therefore requires a glass transition above 205 °C, which is not met by HT-EL-200. The UL relative thermal index for this product class is typically 170 °C mechanical and 180 °C electrical per UL 746B. Operation above these limits accelerates oxidative degradation of the bisphenol A novolac network and reduces flexural strength retention below 70% after 1,000 h.

    Storage modulus at 25 °C is 5.8 GPa, at 150 °C is 2.5 GPa, and at 200 °C is 1.2 GPa. Rapid drop in modulus near the glass transition permits stress relaxation in encapsulated wire bonds, but also reduces mechanical support for heavy surface-mount components under vibration. Thermal shock resistance is validated by 500 cycles from -40 °C to 150 °C on 5 mm sections per IEC 60068-2-14 without cracking or delamination from alumina substrates.

    Large-mass cure is a significant processing boundary. The epoxy-anhydride reaction exotherm can raise internal temperature above 180 °C in a 1,000 g mass cured at 60 °C, producing thermal runaway and yellowing. The maximum recommended single-shot mass is 200 g for open potting. Larger modules are potted in staged layers with section thickness limited to 10 mm or cured under a temperature ramp with a 1 K/min rise to 100 °C followed by a 2 h dwell before final post-cure.

    When filler loading is increased for thermal conductivity, rheology and dielectric strength move in opposite directions

    Substitution of fused silica with alumina filler raises thermal conductivity to 1.2 W/m·K at 60 wt% loading, but increases mixed viscosity to 9,000 mPa·s at 25 °C and reduces dielectric strength to 15 kV/mm. For high-voltage electronic/EL assemblies, this trade-off is generally unfavorable because the larger particle-size distribution required for high filler loading can create phase-boundary voids. The standard HT-EL-200 formulation uses a broad bimodal fused-silica distribution to limit viscosity increase while maintaining a low ionic impurity background. Particle settling in the resin component remains a batch-control issue: bottom-third viscosity can be 15% higher after 30 days of static storage, and resin drums should be rolled or slow-mixed at 30 °C for 20 min before use.

    The adhesive is not compatible with free amine-based additives. Contact with tertiary amines or primary aliphatic amines causes premature crosslinking, exothermic gas evolution, and carbon dioxide release in open potting. Contamination from tin-catalyzed silicone spray on the production line can depress adhesion to aluminum housings and should be excluded from the potting area. The system also absorbs moisture from humid air; exposure of mixed material to relative humidity above 60% for more than 15 min can increase surface tack and reduce post-cure hardness by 5 Shore D points.

    Compliance requirementMethod or directiveCured-product status
    RoHS restricted substances2011/65/EU Annex IIPass
    REACH candidate list SVHCREACH Article 59No SVHC above 0.1% w/w
    FlammabilityUL 94V-0 at 3.0 mm thickness
    Halogen contentIEC 61249-2-21Chlorine 900 ppm, bromine 900 ppm, total halogens 1,500 ppm
    OutgassingASTM E595TML 0.35%, CVCM 0.08%, WVR 0.12%
    Extractable ionic contaminationIPC-TM-650 2.3.25Chloride 18 ppm, sodium 5 ppm, potassium 5 ppm
    Dielectric strengthASTM D14922 kV/mm on 2 mm cured plaque at 25 °C
    Comparative tracking indexIEC 60112600 V
    Thermal decomposition temperature at 5% mass lossISO 11358-1348 °C in nitrogen

    Shelf life for the resin component is 12 months at 5 ± 3 °C in sealed containers. The anhydride hardener has a shelf life of 6 months at 25 °C. Storage below -20 °C can crystallize methylhexahydrophthalic anhydride; crystallization is reversed by holding the sealed container at 40 °C for 24 h with slow agitation. Mixing ratio is 100:80 by weight resin to hardener with a ratio tolerance of ±2%. Deviations greater than ±2% lower glass transition temperature by more than 8 K and increase high-temperature dielectric loss.

    The potting adhesive is validated for encapsulated ignition coils, ABS sensor housings, DC-DC converter inductors, electroluminescent display ballast enclosures, LED driver modules, and industrial power supplies. Not recommended applications include direct contact with ketone or chlorinated solvents above 60 °C, large-area flexible circuits requiring elongation above 5%, and implantable medical devices where ISO 10993 biocompatibility has not been evaluated. In applications where hot oil immersion is specified, swelling after 500 h at 150 °C is below 3% per ASTM D471, whereas condensation-cure silicone potting typically swells more than 10% under equivalent conditions.

    Top