| HS Code | 719655 |
| Dielectric Strength | ≥20 kV/mm |
| Volume Resistivity | ≥1.0×10^15 Ω·cm |
| Dielectric Constant | 3.0–3.5 at 1 kHz |
| Dissipation Factor | ≤0.001 at 1 kHz |
| Operating Temperature Range | -50°C to +250°C |
| Thermal Stability | Retains properties after 1000 h at 200°C |
| Ionic Impurity Content | Na+ ≤2 ppm, K+ ≤2 ppm, Cl- ≤5 ppm |
| Viscosity | 500–2000 mPa·s at 25°C |
| Solids Content | 50–70 wt% |
| Refractive Index | 1.50–1.55 |
| Water Absorption | ≤0.1% |
| Adhesion | Good adhesion to metal, glass, and ceramic substrates |
As an accredited Electronic grade Silicone Resin Electronic/EL Grade factory, we enforce strict quality protocols—every batch undergoes rigorous testing to ensure consistent efficacy and safety standards.
| Packing | Packaged in 1 kg sealed glass bottles under inert nitrogen, with tamper-evident caps, ensuring high-purity EL grade silicone resin integrity. |
| Container Loading (20′ FCL) | Electronic-grade silicone resin, EL grade, packed in sealed drums on pallets, loaded securely into 20-ft FCL container with proper labeling and bracing. |
| Shipping | Electronic/EL Grade Silicone Resin is shipped in sealed, corrosion-resistant containers under inert atmosphere to prevent contamination and moisture uptake. Transport follows hazardous cargo regulations, with temperature control and cushioning to avoid leakage or damage. Proper labeling, documentation, and clean-room-grade handling ensure purity is maintained throughout transit. |
| Storage | Store Electronic/EL Grade Silicone Resin in its original, tightly sealed container in a clean, cool, dry, and well-ventilated area. Protect from moisture, direct sunlight, and heat sources. Keep away from strong oxidizing agents. Avoid contamination and physical damage. Maintain temperatures between 5–35°C to preserve purity and performance. Follow manufacturer shelf-life guidelines. |
| Shelf Life | Shelf life is 12 months from manufacturing date when stored unopened, tightly sealed, below 25°C, protected from moisture. |
| Resin loading (wt%) | Refractive index ASTM D542 | Shore D ASTM D2240 | Dielectric strength ASTM D149 | Tensile strength ASTM D412 |
|---|---|---|---|---|
| 40 | 1.535 | 55 | 19 kV/mm | 4.2 MPa |
| 50 | 1.54 | 60 | 20 kV/mm | 4.5 MPa |
| 60 | 1.545 | 68 | 21 kV/mm | 5.8 MPa |
| Standard or method | Test condition | Production requirement |
|---|---|---|
| IPC-CC-830B / MIL-I-46058C | 25–75 µm dry film on FR-4 coupon | No delamination, bubbles, or corrosion |
| UL 94 | 50 µm cured film on glass substrate | V-0 |
| ASTM D257 | 500 V DC, 25°C | Volume resistivity > 1×10¹⁴ Ω·cm |
| IEC 60112 | Ammonium chloride droplet method | Comparative tracking index > 600 V |
| ASTM D149 | Oil immersion, 25°C, 60 Hz | Dielectric strength > 18 kV/mm |
Competitive Electronic grade Silicone Resin Electronic/EL Grade prices that fit your budget—flexible terms and customized quotes for every order.
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The silicone resin designated Electronic/EL Grade is a filtered electronic-purity polysiloxane supplied as a two-part addition-cure system. The grade suffix operates as the product model designation in component databases; no separate alphanumeric resin code is assigned in the present specification. Formulation targets for the Electronic/EL Grade address three properties simultaneously: extractable ionic cleanliness, volatile condensable content, and optical transmission after thermal cure. The material is intended for LED encapsulation, optocoupler assembly, electroluminescent lamp insulation, conformal coating of sensor modules, and die-coating layers in power packages. Typical uncured viscosity is 800–8,000 mPa·s at 25 °C. The resin cures by platinum-catalysed hydrosilylation in 1–2 h at 100–150 °C. The cured network has Shore A hardness between 35 and 70 and is formulated with a phenyl-methyl siloxane backbone to balance refractive index against thermal yellowing.
The specification set includes extractable chloride below 5 ppm, sodium below 2 ppm, and potassium below 1 ppm as determined by IPC-TM-650 method 2.3.25 or equivalent ion-chromatography extraction. Outgassing acceptance limits follow ASTM E595-15, with total mass loss below 0.10 % and collected volatile condensable material below 0.01 %. Dielectric strength is tested per ASTM D149 in the range 15–25 kV/mm. Volume resistivity per ASTM D257 is in the range 1014–1015 Ω·cm. The dielectric constant at 1 MHz is 2.6–3.5, and the dissipation factor is 0.001–0.01. A 2 mm cured section typically transmits more than 90 % of incident light across the 400–900 nm range after full cure, although haze and blue absorption depend on phenyl content.
Under 85 °C/85 % RH ageing at 1000 h, the cured Electronic/EL Grade retains a volume resistivity above 1×1012 Ω·cm. General-purpose silicone resins with higher chloride and sodium content may fall below 1×109 Ω·cm under the same bias conditions because water-soluble residues form conductive paths at the substrate interface. The Electronic/EL Grade reduces silanol content to below 0.1 wt%. Water absorption of the cured network is 0.1–0.2 % after 24 h immersion at 23 °C per ASTM D570. These values support use in high-impedance circuits and in automotive modules subjected to condensation cycling, provided the package design does not depend on the silicone as a moisture barrier.
In highly accelerated stress testing per JESD22-A110, the failure mode is typically not bulk dielectric breakdown but interfacial ionic migration. The Electronic/EL Grade is screened at 130 °C/85 % RH under 5 V or 10 V bias for 96 h; acceptance testing of packaged devices observes leakage current below the device-specific limit and no electrochemical dendritic growth on silver-plated leadframes. These data are generated on production packages with wire-bonded test dies rather than on free-standing resin coupons.
On automated LED package lines, the resin is metered through static mixing nozzles with 18–24 mixing elements and dispensed through 24–27 gauge needles at 0.2–0.6 MPa; typical shot volumes range from 5–30 µL. The low ionic content reduces silver-mirror tarnishing and bond-pad corrosion on plated leadframes. For optocouplers, the cured resin provides optical coupling across the isolation gap without depositing condensable films on emitter or detector surfaces. In power modules, the material is used as a low-modulus die-coating layer below silicone gel; the cured modulus remains below 10 MPa at 25 °C, lowering stress on 25 µm aluminium bond wires. In electroluminescent lamp construction, the Electronic/EL Grade is used between ITO-coated films and phosphor layers, where controlled capacitance and low pinhole density are specified. The grade suffix in these applications identifies the low-outgassing and ionic-purity subset rather than a single cure chemistry.
For sensor modules, the resin is applied as a conformal coating at 50–150 µm wet thickness. The low glass-transition temperature, below -40 °C, prevents the coating from cracking when the substrate flexes. In optical sensors, the refractive index formulation is matched to borosilicate glass or polycarbonate windows; refractive index values from 1.40 to 1.54 are produced by varying phenyl content. Published data for specific automotive optical sensor configurations is limited, so qualification is performed on the actual package stack.
High-temperature reverse bias testing at 150 °C and blocking voltages of 600–1200 V stresses the resin through ionic migration and oxidative embrittlement. The Electronic/EL Grade is accepted for HTRB screening when sodium and chloride are controlled to below 2 ppm and 5 ppm, respectively. The practical ceiling is not bulk thermal decomposition, which is observed only above 250 °C in air for this siloxane family, but the accumulation of mobile ions at the die passivation surface. Because the cured resin remains permeable to oxygen and water vapour, it is not a hermetic barrier; additional silicon nitride or metal passivation is required for long-term hermetic environmental protection. Amine-based adhesion promoters are excluded because residual amines inhibit platinum cure and promote yellowing at continuous temperatures above 150 °C. Silane coupling agents with methoxy or ethoxy functionality are used at 0.5–1.0 wt% to improve adhesion to aluminium and silver-plated copper leadframes without causing premature crosslinking.
For glob-top application on FR-4, the board is prebaked at 125 °C for 4 h to remove residual moisture. Plasma treatment at 200–300 W with argon or oxygen for 60–120 s raises the solder-mask surface energy above 60 mN/m. The resin is dispensed at 30–40 °C to lower viscosity without severely reducing pot life. Pot life at 25 °C is 8–24 h; at 40 °C it shortens to 2–6 h. A stepped cure of 80 °C for 30 min followed by 150 °C for 1 h reduces bubble entrapment and avoids surface skinning. The coefficient of thermal expansion of the cured unfilled resin is approximately 200–300 ppm/°C, while FR-4 in-plane expansion is 14–17 ppm/°C. The mismatch is compensated by limiting glob-top thickness to 1.0 mm and by using the low-modulus silicone rather than rigid epoxy; the soft network does not transmit sufficient stress to lift bond pads during thermal cycling from -40 °C to 125 °C.
Relative to an industrial silicone resin, the Electronic/EL Grade differs in monomer handling and filtration. Industrial methyl silicone resins may contain residual chlorosilane hydrolysis by-products and are not filtered to electronic assembly standards. The electronic grade uses washed and distilled cyclosiloxane monomers to reduce chloride-bearing species, followed by filtration below 0.2 µm. The platinum catalyst and inhibitor package is adjusted to provide storage stability of 12 months at 5–30 °C in sealed containers. Relative to a bisphenol-A epoxy glob-top, the silicone has higher gas permeability, lower tensile adhesion, and lower hardness. Tensile strength is 2–8 MPa per ASTM D638, compared with 40–80 MPa for rigid epoxy encapsulants. Elongation is 30–200 %, while epoxies rupture below 5 %. The silicone therefore absorbs wire sweep and thermal excursion deformation but provides less protection against moisture ingress and negligible gas barrier performance.
Compared with polyurethane encapsulants, the silicone provides higher continuous-use temperature, typically 200 °C, and lower moisture sensitivity during cure. Polyurethane systems may show better abrasion resistance but are more sensitive to hydrolysis above 85 °C/85 % RH. The silicone also has lower modulus and higher compliance but lower tensile strength. These differences are measured through ASTM D638 and ASTM D257 rather than inferred from chemistry alone.
In comparative outgassing testing, the Electronic/EL Grade is differentiated from industrial silicone by a total mass loss below 0.10 % and a collected volatile condensable material below 0.01 %. Epoxy encapsulants can meet similar outgassing limits but may introduce higher chloride and higher cure shrinkage. The selection of silicone over epoxy is therefore driven by stress management and high-temperature dielectric stability, not by outgassing alone.
| Test / Standard | Condition | Acceptance value for Electronic/EL Grade |
|---|---|---|
| ASTM E595-15 | 125 °C, 24 h, vacuum | TML <0.10 %, CVCM <0.01 % |
| IPC-TM-650 2.3.25 | Extraction at 121 °C, 100 % RH | Na⁺ <2 ppm, K⁺ <1 ppm, Cl⁻ <5 ppm |
| ASTM D257 | 500 V DC, 25 °C | Volume resistivity >1×1014 Ω·cm |
| ASTM D149 | 0.5 kV/s, 25 °C | Dielectric strength >15 kV/mm |
| ASTM D570 | 24 h, 23 °C immersion | Water absorption <0.2 % |
| UL 94 | 3.0 mm thickness | V-0 |
Extractable ionic cleanliness is the primary specification that separates the Electronic/EL Grade from general-purpose silicone resin. The acceptance matrix above is applied to each production lot, and the filtration process is verified by particle counts below 100 particles/cm³ at sizes larger than 0.5 µm. These controls are required when the resin is used adjacent to wire bonds, silver-plated leadframes, or optical detector surfaces where trace contamination changes device yield or field reliability.