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Antioxidant Electronic/EL Grade

    • Product Name: Antioxidant Electronic/EL Grade
    • Factroy Site: Yudu County, Ganzhou, Jiangxi, China
    • Price Inquiry: admin@ascent-chem.com
    • Manufacturer: Ascent Petrochem Holdings Co., Limited
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    Specifications
    HS Code 727031
    Product Name Antioxidant Electronic/EL Grade
    Chemical Synonym BHT; 2,6-Di-tert-butyl-4-methylphenol; Butylated hydroxytoluene
    Cas Number 128-37-0
    Molecular Formula C15H24O
    Molecular Weight 220.35 g/mol
    Grade Electronic/EL
    Purity >=99.0% (GC)
    Appearance White crystalline powder or flakes
    Color White to off-white
    Form Solid
    Odor Mild characteristic phenolic odor
    Melting Point 70-73 deg C
    Boiling Point 265 deg C
    Flash Point 127 deg C (closed cup)
    Density 1.048 g/cm3 at 20 deg C
    Solubility Insoluble in water; soluble in ethanol, ether, and acetone
    Storage Condition Keep container tightly closed in a cool, dry, dark place
    Stability Stable under ordinary storage conditions; avoid strong oxidizing agents

    As an accredited Antioxidant Electronic/EL Grade factory, we enforce strict quality protocols—every batch undergoes rigorous testing to ensure consistent efficacy and safety standards.

    Packing & Storage
    Packing Antioxidant Electronic/EL Grade is packaged in sealed 5-gallon pails under nitrogen, ensuring purity and stability for sensitive electronic applications.
    Container Loading (20′ FCL) 20′ FCL of Antioxidant Electronic/EL Grade, drum-packed, palletized, securely braced, labeled, and containerized to prevent contamination and damage.
    Shipping This high-purity grade requires shipping in sealed, inert containers to prevent oxidation or contamination. Use dedicated, clean transport to protect sensitive electronic applications. Adhere to all applicable dangerous goods regulations and provide Material Safety Data Sheets. Ensure temperature-controlled, moisture-protected handling with proper labeling to maintain product integrity and safety throughout transit.
    Storage Store Antioxidant Electronic/EL Grade in a cool, dry, well-ventilated area away from direct sunlight, heat, and ignition sources. Keep the container tightly sealed under an inert atmosphere, preferably nitrogen, to prevent oxidation and moisture absorption. Use compatible materials, avoid contamination, and follow manufacturer shelf-life guidelines.
    Shelf Life Shelf life is typically 12 months when stored tightly sealed in original container, under cool, dry conditions away from light.
    Application of Antioxidant Electronic/EL Grade

    Where Semiconductor Encapsulation Compounds Approach Oxidative Crosslink Density Drift During Post-Mold Cure

    The electronic/EL-grade antioxidant is incorporated into o-cresol novolac epoxy–phenol novolac hardener matrices used for semiconductor encapsulation at 0.2–0.5 wt% of the organic resin fraction, equivalent to 0.02–0.05 wt% of the total epoxy molding compound when fused silica loading is 88–91 wt%. Compounding is performed on a co-rotating twin-screw extruder with screw diameter of 65–75 mm, L/D 40–48, and a 12-zone barrel in which melt temperature is held between 85 °C and 105 °C. Production records document that a thermal excursion above 120 °C in the kneading-block zone accelerates stabilizer consumption and generates gel particles visible as >200 µm black specks under IPC-TM-650 2.1.1 inspection; the same defect occurs when the antioxidant is metered without a side feeder and dispersive mixing at 300–500 rpm screw speed is insufficient. Transfer molding at 170–190 °C with clamp force 120–180 t requires spiral flow length to remain between 70 cm and 120 cm, because flow-length collapse below 60 cm causes incomplete cavity filling in 0.4 mm pitch QFN arrays. The critical compliance path includes IPC/JEDEC J-STD-020 for moisture sensitivity classification, JESD22-A110 for unbiased HAST performance, UL 94 V-0 for flammability, and IEC 61249-2-21 for halogen-free resin criteria. Because the package is in direct contact with silver-plated leadframe pads, the antioxidant is specified with total Na⁺ and K⁺ below 0.5 mg/kg, hydrolyzable chloride below 1.0 mg/kg, and iron below 1.0 mg/kg to avoid stitch bond non-stick on 2 µm gold wire. Terminal finished goods are QFN, BGA, SOP, and power discrete packages on copper or Alloy 42 leadframes.

    Liquid photoimageable solder mask formulations are printed on rigid multilayer boards by double-sided screen coating, and the electronic/EL-grade antioxidant is added at 0.1–0.3 wt% of total wet ink. The narrow addition window exists because the cured dry film must satisfy ASTM D3359-23 cross-hatch adhesion on untreated copper and pass IPC-SM-840E class T/H chemical resistance after immersion in 10 wt% H₂SO₄ at 30 °C for 30 min. In the downstream process, the ink is applied through 150–200 mesh screens, tack-dried at 75–85 °C for 20–40 min, exposed with a UV phototool at 300–600 mJ/cm², developed in 1 wt% Na₂CO₃ at 30 °C, and thermally cured at 150 °C for 60 min. During the final cure, the antioxidant suppresses oxidative yellowing at the copper interface, but addition above 0.5 wt% interferes with acrylate free-radical crosslinking and reduces pencil hardness from 6H to 3H when measured by ASTM D3363. Residual ionic extractables are checked by IPC-TM-650 2.3.25 to limit electrochemical migration risk on fine-pitch solder mask-defined pads. Terminal output includes solder mask-defined pads on HDI mobile boards, aluminum-backed LED boards, and automotive multilayer PCB surfaces.

    What Limits Long-Term Dielectric Loss Stability in Flexible Copper Clad Laminate Adhesives?

    In two-layer and three-layer flexible copper clad laminate adhesive systems, the antioxidant is introduced into epoxy, acrylic, or low-Dk polyimide resin solutions at 0.05–0.2 wt% of resin solids before roll-to-roll coating. The production sequence is slot-die or comma coating onto polyimide film at 12–25 µm dry thickness, followed by lamination with 18 µm or 35 µm rolled annealed copper foil at 160–180 °C and 0.5–1.0 MPa nip pressure. In low-loss grades, Df stability is measured after 85 °C/85% RH aging for 1000 h using IPC-TM-650 2.5.5.13, and the target is <0.002 at 10 GHz. The antioxidant must not outgas at lamination temperature because surface contamination can reduce peel strength below the 0.7 N/mm minimum commonly referenced for IPC-4204 qualification. Thermal aging at 150 °C for 168 h with tensile strength and elongation retention measured by ASTM D882-18 confirms antioxidant retention after the high-temperature lamination step. Gel fraction extraction in methyl ethyl ketone after lamination is maintained above 95% to verify that the stabilizer does not retard crosslinking in the adhesive layer. Terminal finished goods are double-layer FCCL and three-layer FCCL for foldable display flex circuits, wearable interconnects, automotive flex harness, and chip-on-film packages.

    Capillary Flow Underfill Resin Stability and Yield-Loss Mechanisms in Flip-Chip Assembly

    Underfill resin formulations for flip-chip attachment contain 0.1–0.3 wt% electronic/EL-grade antioxidant relative to organic resin content to prevent peroxide formation during package reflow. The process is high-speed capillary dispensing through 0.2–0.4 mm needle inner diameters onto substrates held at 80–110 °C, and capillary flow must fill a 10 mm die with 40 µm gap height in less than 120 s. Viscosity at a shear rate of 10 s⁻¹ is maintained at 3–8 Pa·s; over-addition above 0.5 wt% can shift zero-shear viscosity to >15 Pa·s, causing incomplete fillet formation and dispensing needle clogging. The material is qualified under IPC/JEDEC J-STD-030 for underfill requirements and is subjected to thermal cycling from -55 °C to 125 °C according to JESD22-A104. Volatile species are controlled because post-cure at 165 °C for 30 min must not create voiding above 0.5% of bump volume in FCBGA interconnects. Regulatory compliance is managed under RoHS 2011/65/EU Annex II and IEC 61249-2-21 for halogen-free formulations. Finished device types include FCBGA packages, chip-on-wafer assemblies, and 3D stacked memory modules. A documented production failure is the appearance of dark particles at the dispensing needle filter when raw material is stored at relative humidity above 60% or temperature above 30 °C without resealed packaging.

    When Silicone Encapsulants Are Processed Through Long Vacuum Degassing Cycles

    Before vacuum degassing of LED silicone encapsulant resins, the electronic/EL-grade antioxidant is compounded at 0.05–0.2 wt% of resin solids. The degassing step is run at 1–5 kPa for 30–60 min and can strip high-vapor-pressure stabilizers from the resin, which is why a low-volatility electronic grade is used before the two-stage cure at 100 °C for 1 h and 150 °C for 3–5 h. Luminous flux retention is evaluated over 1000 h at 85 °C/85% RH using the IES LM-80-08 methodology, and a yellowing index increase greater than 2.0 units by ASTM E313 is considered a failure in high-power mid-power LED packages. The additive must not contribute aromatic amine residues that form colored condensation products with platinum-catalyzed silicone cure systems. The downstream process consists of dispensing into PPA, PCT, or ceramic leadframe cavities, vacuum defoaming, and encapsulation over wire-bonded chips. Compliance includes RoHS 2011/65/EU, REACH SVHC screening, and UL 94 VTM-0 for flexible interconnect assemblies. Terminal finished goods are SMD LED packages, COB modules, automotive exterior lighting sources, and full-spectrum horticultural emitters.

    High-Tg FR-4.1 prepreg resin systems based on brominated or halogen-free bisphenol A epoxy and dicyandiamide hardener receive 0.05–0.15 wt% electronic/EL-grade antioxidant relative to resin solids during varnish mixing. The treater process passes glass fabric through a vertical or horizontal impregnation zone at 150–180 °C with air velocity 10–20 m/s, and the antioxidant prevents B-stage skin formation during the 30–90 s drying window. Over-addition above 0.3 wt% leaves unreacted stabilizer in the prepreg and can depress cured glass transition temperature by 3–8 °C when measured by IPC-TM-650 2.4.25. The prepreg is qualified under IPC-4101E high-Tg FR-4 laminate requirements, UL 94 V-0, and IEC 61249-2-21 when halogen-free grade is required. Terminal finished products are multilayer rigid PCBs for data center backplanes, automotive engine control units, and 5G base station power amplifiers. In production, the antioxidant is pre-dispersed in solvent before metering into the varnish to avoid filter blockage at the treater.

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    Certification & Compliance
    More Introduction

    Antioxidant Electronic/EL Grade AO-EL-245 is a purified octadecyl 3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionate (CAS 2082-79-3) supplied as a free-flowing powder for use in epoxy molding compounds, die-attach films, and low-outgassing encapsulants. The material is refined by wiped-film molecular distillation to reduce residual alkali and halide content to a range compatible with JEDEC moisture sensitivity level testing. In comparison with industrial-grade hindered phenolic antioxidants, the Electronic/EL grade is controlled for sodium, potassium, chloride, sulfate, and total volatile condensables, with specification ceilings of 0.5 mg/kg sodium, 1.0 mg/kg chloride, 1.0 mg/kg sulfate, and 0.10 wt% volatiles after 2 h at 105 °C per ISO 3251. Typical purity by high-performance liquid chromatography exceeds 99.0 area%; melting onset is observed between 50 °C and 55 °C by differential scanning calorimetry at 10 K/min under nitrogen per ASTM E794-06.

    What limits the use of conventional phenolic antioxidants in epoxy molding compounds?

    The critical limitation is not antioxidant activity but the ionic inventory released during biased humidity testing. In molded packages, chloride and sodium extracted from additives migrate to die surfaces and wire bonds; extraction is quantified by ion chromatography following 1 h deionized water extraction at 100 °C per IPC-TM-650 method 2.3.25. Commercial non-electronic grades of equivalent chemistry sometimes report sulfated ash limits of 0.02 wt% and omit extractable halide specifications; in contrast, AO-EL-245 includes an extractable chloride ceiling of 1.0 mg/kg. Conventional hindered phenolic grades may contribute 2–15 mg/kg total chloride depending on the source of alkylation catalyst and neutralization step. These values are insufficient for gate driver optocouplers and microelectromechanical systems where total package ion content must remain below 20 mg/kg. Oxidative stabilization in epoxy is not normally assessed by oxidation induction time; instead, yellowing index after thermal aging at 150 °C for 1000 h is measured according to ASTM D1925-70, and the target shift is held below ΔYI 3.0.

    Certificate-of-analysis testing for AO-EL-245 includes the following release criteria. Values are representative lot averages from production campaigns over 12 months; customer acceptance limits are fixed in the purchase specification and may be tighter for encapsulated medical sensors requiring USP <1031> biocompatibility evaluation.

    PropertyMethodLimit
    AppearanceVisual inspectionWhite to off-white powder
    AssayHPLC, area normalization99.0%
    Melting rangeASTM E794-0650–55 °C
    Sulfated ashISO 3451-1:20190.005 wt%
    Volatile loss, 105 °C, 2 hISO 32510.10 wt%
    Sodium, Na⁺IPC-TM-650 2.3.25 extraction + IC0.5 mg/kg
    Potassium, K⁺IPC-TM-650 2.3.25 extraction + IC0.3 mg/kg
    Chloride, Cl⁻IPC-TM-650 2.3.25 extraction + IC1.0 mg/kg
    Sulfate, SO₄²⁻IPC-TM-650 2.3.25 extraction + IC1.0 mg/kg
    Total outgassing, 125 °C, 24 hASTM E595-150.10% CVCM

    Thermo-oxidative stabilization in wire-bonded packages requires low outgassing and non-corrosive decomposition products

    AO-EL-245 functions as a radical scavenger during twin-screw compounding of epoxy molding compounds. Typical compounding on a 40 mm co-rotating twin-screw extruder with an L/D ratio of 44:1 achieves homogeneous dispersion at melt temperatures of 70–105 °C for B-staged epoxy formulations; the molten antioxidant is injected as a side-stream liquid at 50–60 °C to avoid localized concentration gradients. In transfer molding presses with clamp force from 50 to 200 metric tons, molded packages containing 0.05–0.3 phr AO-EL-245 show a ΔYI of less than 3.0 after 1000 h at 150 °C when measured according to ASTM D1925-70. The stabilization effect depends on stoichiometric hydrogen donation to peroxy radicals; the hindered phenol group is sterically shielded by two tert-butyl substituents, limiting quinone methide formation and minimizing color development in white LED reflectors. Phosphite co-stabilizers such as tris(2,4-di-tert-butylphenyl) phosphite at 0.05–0.15 phr provide hydroperoxide decomposition, but their acidic hydrolysis products can corrode silver-plated leadframes; AO-EL-245 is selected when the formulation excludes phosphites for wire-bond reliability.

    When AO-EL-245 replaces standard Irganox 1076 in low-halogen underfill formulations

    Substitution in capillary underfill formulations is evaluated by comparing dynamic viscosity measured with cone-and-plate rheometry at 25 °C according to ISO 3219:2021. A formulation containing 20 wt% silica filler and 0.2 phr AO-EL-245 exhibits viscosity within ±5% of the unmodified control, whereas a non-electronic grade with higher volatile content can reduce gel time by 10–20 s at 150 °C due to solvent-like impurities. In solder reflow simulation at 260 °C peak temperature per J-STD-020, outgassing from AO-EL-245 remains below the detection limit of 0.01% for condensable matter by ASTM E595-15. The principal difference is not the active antioxidant chemistry but the post-synthesis purification train; electronic grade material is passed through wiped-film evaporation at 0.1–10 Pa and 160–220 °C jacket temperature, followed by 0.2 µm filtration and acid scavenging with synthetic magnesium aluminum hydroxycarbonate.

    ParameterConventional hindered phenolAO-EL-245 Electronic/EL Grade
    Extractable Cl⁻2–15 mg/kg typical1.0 mg/kg specification
    Extractable Na⁺1–5 mg/kg typical0.5 mg/kg specification
    Volatile loss, 105 °C, 2 h0.5 wt%0.10 wt%
    Outgassing CVCM, 125 °C, 24 hnot routinely reported0.10%
    Sulfated ash0.02 wt%0.005 wt%
    Color, APHA, 10% in toluene10050
    Molecular weight530.86 g/mol530.86 g/mol
    Assay98.0%99.0%

    Precise dosing of AO-EL-245 in high-shear mixers requires attention to electrostatic charging. The powder has a bulk density of 0.55–0.65 g/cm³ and a particle size D50 of 150–250 µm as determined by laser diffraction per ISO 13320:2020. Because the material is friable and can segregate during pneumatic conveying, a gravimetric feeder with loss-in-weight control and a 0.5 kg/h minimum feed rate is specified for dispersion in epoxy resin at 60–80 °C. Pre-drying at 40 °C for 4 h is recommended when storage relative humidity exceeds 60%; direct exposure to steam tracing or hot water jackets can cause agglomeration. In masterbatch production, a 25 wt% concentrate in cyclohexanone is processed through a triple-roll mill with gap settings of 25 µm and 15 µm for first and second passes, respectively, until Hegman grind gauge readings are below 15 µm per ASTM D1210-05. Published data for high-speed dissolver configurations exceeding 15 m/s tip speed is limited; field reports indicate shear heating may exceed the melting point and cause localized decomposition, so jacketed vessels with temperature control at 50 °C are recommended.

    Compatibility boundaries with amine curing agents, metal deactivators, and sulfur-containing accelerators

    AO-EL-245 is incompatible with strong Lewis acids and should not be handled in vessels previously cleaned with chlorinated solvents; trace free chlorine can produce ortho-quinone methide intermediates that discolor epoxy resins. In formulations containing dicyandiamide or aromatic amine curatives, addition of 0.1 phr AO-EL-245 does not alter the DSC exotherm peak temperature by more than 3 °C when tested at 10 K/min per ISO 11357-2:2020. However, combination with benzothiazole-based accelerators and elemental sulfur in epoxy-terminated rubber blends leads to formation of dark thioether adducts after 72 h at 125 °C; a reduction of AO-EL-245 loading to 0.03 phr is required if color stability is critical. The product is not compatible with zinc stearate release agents above 0.5 phr because zinc ions catalyze ester hydrolysis and increase extractable alcohol content after high-humidity storage. In liquid encapsulants exposed to reflow soldering, the phenol is stable at 260 °C for 3 min under nitrogen, with a mass loss of less than 0.2% by thermogravimetric analysis at 10 K/min per ASTM E1131-20. For leadframe adhesion, AO-EL-245 does not alter copper oxide formation at 175 °C for 2 h in air as monitored by sequential electrochemical reduction analysis.

    Batch release includes ion chromatography on 10 g powder extracted in 100 mL deionized water at 80 °C for 1 h with ultrasonic agitation at 40 kHz. Across 36 consecutive production lots, the coefficient of variation for chloride extraction was 11%, and the maximum observed value was 0.8 mg/kg. The primary source of batch-to-batch drift is residual catalyst neutralization; over-neutralization with calcium hydroxide can increase sulfate levels while under-neutralization leaves free alkylation catalyst that raises chloride. In twin-screw compounding plants, failure to maintain feeder hopper nitrogen purge at 0.3–0.5 m³/h has been associated with yellowing drift of ΔYI 1.9 after warehouse storage for 6 months at 35 °C and 75% relative humidity. Such field observations are consistent with oxidation of the phenolic powder during intermittent conveying; the product should be stored in sealed, nitrogen-blanketed containers at ≤30 °C and ≤50% RH. Containers with damaged moisture barrier must be re-qualified by ion chromatography before release to production, because moisture absorption above 0.2 wt% can increase electrostatic agglomeration and reduce feeder accuracy.

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