Products

Antioxidant (BASF Irganox 1010) Electronic/EL Grade

    • Product Name: Antioxidant (BASF Irganox 1010) Electronic/EL Grade
    • Factroy Site: Yudu County, Ganzhou, Jiangxi, China
    • Price Inquiry: admin@ascent-chem.com
    • Manufacturer: Ascent Petrochem Holdings Co., Limited
    • CONTACT NOW
    Specifications
    HS Code 822860
    Chemical Name Pentaerythritol tetrakis(3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionate)
    Cas Number 6683-19-8
    Molecular Formula C73H108O12
    Molecular Weight 1177.65 g/mol
    Appearance White to off-white crystalline powder
    Melting Point 110-125 °C
    Purity ≥98% (Electronic/EL Grade)
    Solubility Soluble in acetone, benzene, ethyl acetate; insoluble in water
    Thermal Decomposition Temperature >280 °C
    Volatility Low volatility
    Specific Gravity 1.15 g/cm³ (approx)
    Flash Point >200 °C (estimated)

    As an accredited Antioxidant (BASF Irganox 1010) Electronic/EL Grade factory, we enforce strict quality protocols—every batch undergoes rigorous testing to ensure consistent efficacy and safety standards.

    Packing & Storage
    Packing High-purity BASF Irganox 1010 Electronic/EL Grade antioxidant, packaged in sealed 20 kg drums under inert conditions to ensure stability.
    Container Loading (20′ FCL) 20′ FCL: 20-foot container loaded with palletized, sealed drums/bags of Antioxidant Irganox 1010 EL Grade, protected from moisture and contamination.
    Shipping Ship in sealed, moisture-barrier containers under inert atmosphere to preserve electronic-grade purity. Avoid exposure to heat, light, and humidity during transit. Use dedicated clean, non-shedding packaging to prevent contamination. Comply with applicable chemical transport regulations, and ensure labels and documentation clearly identify the material's grade and handling requirements.
    Storage Store in a tightly sealed original container in a cool, dry, well-ventilated area, away from direct sunlight, heat, and oxidizing agents. Protect from moisture and physical contamination to maintain its Electronic/EL grade purity. Keep temperatures moderate and stable. When handled correctly under clean conditions, shelf life can be preserved for several years.
    Shelf Life Store in a cool, dry place. Shelf life is typically 2 years from manufacture date when container remains sealed.
    Application of Antioxidant (BASF Irganox 1010) Electronic/EL Grade

    When Transfer Molding Epoxy Compounds, Antioxidant Loading Shifts Spiral Flow Stability and Wire Bond Pad Discoloration

    In transfer-molded semiconductor encapsulation based on biphenyl or cresol novolac epoxy resins, pentaerythritol tetrakis(3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionate) is incorporated at 0.1–0.5 phr on total resin solids, with critical evaluations concentrated in the 0.2–0.35 phr band because lower loadings fail to suppress oxidative yellowing of silver-plated copper leadframes during post-mold cure, while higher loadings reduce spiral flow length at 175 °C and 70 kgf/cm² transfer pressure below vendor-specific limits. The compound is produced on heated two-roll mills or z-blade kneaders at 80–110 °C, where the antioxidant is pre-mixed with silane coupling agent, carnauba wax, and ion-capture additives before silica filler addition to avoid high-viscosity zones that generate localized thermo-oxidative degradation. Spiral flow is monitored according to ASTM D3123 using a semi-logarithmic flow channel at 175 °C; batch-to-batch variation outside the qualified flow envelope correlates with gate-region voiding and wire sweep in high-pin-count packages. The molded package is cured at 175–185 °C for 60–120 s, followed by post-mold cure at 175 °C for 4–8 h. Compliance verification for the finished EMC includes UL 94 V-0 flame classification, JEDEC J-STD-020D.1 moisture sensitivity classification, IPC/JEDEC J-STD-033 bake condition compliance, RoHS 2011/65/EU, and REACH SVHC conformity. Terminal parts produced from the stabilized compound include quad flat packages, ball grid arrays, and small outline packages. Operational boundary: iron contamination from milling equipment accelerates phenolic antioxidant consumption; therefore, chromium/nickel-hardened contact surfaces are specified, and ferrous contamination in the granulate is controlled below 50 mg/kg by neodymium magnet separation.

    Photoimageable solder mask layers based on epoxy acrylate or novolac epoxy acrylate oligomers are exposed to a final thermal cure that induces yellowing on copper-clad laminate substrates when residual photoinitiator fragments and transition metal residues from adhesion promoters promote aerobic oxidation of the cured film. The electronic grade antioxidant is added at 0.3–0.8 wt% of solvent-free solids to preserve CIE b* below 2.5 after cure at 150–160 °C for 30–60 min; formulations that omit this stabilization can exceed 5.0 b* in the same cure segment, which reduces contrast for automated optical inspection. In production, the liquid resist is pre-mixed in a high-speed dissolver and then passed through a three-roll mill at a controlled paste temperature below 30 °C; screen printing or curtain coating deposits a wet film that is pre-baked at 75–80 °C to remove solvent without triggering thermal polymerization. UV exposure at 400–800 mJ/cm² in the 365 nm i-line region is followed by aqueous development in 1% sodium carbonate at 28–32 °C, and the final thermal cure completes crosslinking. Compliance is assessed through IPC-SM-840D Class T requirements, ionic contamination testing per IPC-TM-650 method 2.3.25, UL 94 V-0, and RoHS 2011/65/EU. Terminal components are solder mask and coverlay layers on HDI smartphone boards, BGA package substrates, and automotive camera PCB modules. Operational limitation: amine-synergist photoinitiator packages should be avoided because tertiary amines accelerate quinone methide formation even when hindered phenolic stabilizer is present.

    Halogen-Free Cable Jacketing Under IEC 60754-2 Acid Gas and IEC 61034 Smoke Limits

    In low-smoke halogen-free jacketing compounds for industrial and data-center power cables, the resin matrix is typically ethylene vinyl acetate or linear low-density polyethylene filled with 60–65 wt% magnesium dihydroxide or aluminum trihydroxide. The compound is produced in a co-rotating twin-screw extruder with L/D 40:1 at melt temperatures of 180–220 °C; the antioxidant is metered into the primary feed throat with the polymer granules to stabilize the polymer before filler-induced high-viscosity dispersive mixing raises melt temperature. Irganox 1010 Electronic/EL grade is used at 0.1–0.4 wt% of total compound, with the lower bound defined by torque rise during compounding and the upper bound restricted by surface exudation after jacket extrusion. The jacket is applied through a crosshead die at 180–230 °C; for electron-beam crosslinked versions, doses from 50–150 kGy are used. Compliance testing includes IEC 60332-1-2 vertical flame propagation, IEC 60754-2 acid gas generation with pH not less than 4.3 and conductivity not greater than 10 µS/mm, IEC 61034-2 smoke density, UL 1581, and RoHS 2011/65/EU. Terminal products are halogen-free jackets for USB power delivery cables, server rack power distribution cables, and industrial control cabinet wiring. Operational boundary: prolonged hopper drying of the compounded pellets above 80 °C should be avoided because non-uniform surface moisture desorption from metal hydroxide fillers can create extrusion surface defects and alter the local stabilizer distribution.

    Application segmentStandard or methodMeasured parameterAcceptance boundary
    Semiconductor encapsulationUL 94 V-0Vertical burn afterflame10 s per specimen; ≤50 s total for five specimens
    Semiconductor encapsulationJEDEC J-STD-020D.1Moisture sensitivity classificationMSL 1 or 3 at 260 °C maximum reflow peak
    Photoimageable solder maskIPC-SM-840D Class TThermal stress, insulation resistanceNo delamination or blister; insulation resistance ≥500 MΩ
    Halogen-free cable jacketIEC 60754-2Acid gas generationpH ≥4.3; conductivity ≤10 µS/mm
    Halogen-free cable jacketIEC 61034-2Smoke densityLight transmittance ≥60% in 3 m cube test
    Connector insulatorUL 746BRelative Thermal IndexWall-thickness-dependent; typically ≥130 °C for 0.75 mm
    Die attach / underfillMIL-STD-883 Method 5011Die shear strengthPackage-specific minimum after thermal aging
    Metallized PP film capacitorIEC 60384-14Dissipation factor1×10⁻³ at 1 kHz

    Long glass-filled polyamide 66 and polybutylene terephthalate connector insulators are injection molded through hot-runner systems with melt residence times that can exceed 10 min at 280–300 °C for polyamide 66 and 250–270 °C for polybutylene terephthalate. Melt viscosity retention is tracked by capillary rheometry; a drop in melt viscosity greater than 15% relative to the as-compounded pellet indicates thermo-oxidative chain scission and correlates with increased gate blush and short-shot variation on multi-cavity tooling. The stabilizer is used as a primary hindered phenol at 0.1–0.3 wt% of the polymer matrix, typically with a secondary phosphite co-stabilizer at 0.05–0.1 wt%, and is introduced before the glass fiber feed in a co-rotating twin-screw extruder with L/D 40:1 to ensure dispersion onto the resin melt rather than adsorption onto the glass roving. Injection molding uses mold temperatures of 80–120 °C; the low ionic inventory of the electronic grade is specified because residual sodium, chloride, or sulfate can migrate from the insulator to solder joints under humid bias and promote dendritic growth. Material qualification follows UL 746B relative thermal index, UL 94 V-0, IEC 60695-2-12 glow-wire flammability index at 850 °C, and IEC 62631-3-1 dielectric strength where applicable. Terminal components include DDR5 DIMM sockets, USB4 Type-C connectors, board-to-board sockets, and automotive high-speed connectors. Incompatibility: polyamide 66 compounds containing halogenated flame retardants require ionic contamination validation because residual metal halides can deactivate hindered phenolic stabilizers and increase the risk of contact corrosion.

    What Limits Shelf Life and Cure Kinetics in Anhydride-Cured Die-Attach Epoxies and Capillary Underfills?

    In anhydride-cured liquid epoxy adhesives used for die attach and capillary underfill, the hindered phenolic antioxidant is incorporated at 0.1–0.5 phr on resin solids to suppress oxidative darkening of the cured network and to maintain adhesion after repeated reflow exposure. Shelf life is governed by viscosity drift at 25 °C; accelerated aging data collected at 40 °C over 8 weeks are used by packaging houses to set cold-chain storage limits. The adhesive is compounded with silver flake or silica filler in a three-roll mill at paste temperatures below 35 °C, after vacuum mixing of liquid epoxy resin, anhydride hardener, and antioxidant, and then dispensed through a positive-displacement pump with volumetric shot accuracy below ±2%. Die-attach packages are cured at 150–180 °C for 1–2 h; capillary underfill snap cure is performed at 165 °C for 5 min, with a subsequent 150 °C post-cure for 30 min to complete conversion. Quality verification includes MIL-STD-883 Method 5011 die shear strength, JEDEC J-STD-020 reflow classification, ASTM D7028 dynamic mechanical glass transition temperature, and ICP-MS trace metal screening for sodium, potassium, and chloride below 5 mg/kg each. Terminal components include flip-chip BGA packages, stacked-die memory packages, and power discrete modules. Operational limitation: filler moisture must be below 0.1 wt% by Karl Fischer titration before mixing; residual moisture hydrolyzes the anhydride hardener, shifts stoichiometry, and lowers the cured glass transition temperature.

    Application scenarioIrganox 1010 loadingEquipmentCritical process boundary
    Epoxy molding compound0.1–0.5 phr on resin solidsHeated two-roll mill / z-blade kneaderPost-mold cure 175 °C for 4–8 h
    Photoimageable solder mask0.3–0.8 wt% solvent-free solidsThree-roll mill, screen printingFinal cure ≤160 °C
    Halogen-free cable jacket0.1–0.4 wt% total compoundCo-rotating twin-screw, L/D 40:1Melt temperature ≤230 °C
    Connector insulator0.1–0.3 wt% polymerTwin-screw L/D 40:1, hot-runner injectionMelt temperature ≤300 °C for PA66
    Die attach / underfill0.1–0.5 phr resin solidsThree-roll mill, positive-displacement dispensePaste temperature ≤35 °C
    Metallized PP film capacitor0.03–0.15 wt% polypropyleneCast-film die, biaxial stretchingOrientation 150–160 °C

    Capacitor-Grade Biaxially Oriented Polypropylene Film at Directional Stretching Temperatures Without Amine-Based Slip Additives

    Metallized polypropylene film capacitors require biaxially oriented polypropylene made from high-isotactic-index resin with minimal ionic and polar residues; the film is extruded through a cast-film die at 230–250 °C and stretched in machine and transverse directions at 150–160 °C. Irganox 1010 Electronic/EL grade is beaded at 0.03–0.15 wt% of the polypropylene resin before extrusion, with the loading selected to pass oxidation induction time measured by ISO 11357-6 at 200 °C while avoiding plate-out during orientation. The film is surface-treated by corona discharge, metallized by vacuum deposition at 10⁻²–10⁻³ mbar, and wound into capacitor elements. Compliance is verified under IEC 60384-14, IEC 60384-1, and UL 1414; dielectric dissipation factor is measured at 1 kHz or 10 kHz, and insulation resistance is evaluated at 100 V and 25 °C after temperature cycling. Terminal products are metallized film capacitors for DC-link snubber circuits, automotive power modules, and resonant converters. Operational limitation: the grade must be characterized for surface leakage current after corona treatment because oxidized oligomer species created by over-treatment can raise dissipation factor; published data for this specific film-handling configuration is limited and therefore pilot-scale metallization trials are required.

    Free Quote

    Competitive Antioxidant (BASF Irganox 1010) Electronic/EL Grade prices that fit your budget—flexible terms and customized quotes for every order.

    For samples, pricing, or more information, please contact us at +8615365186327 or mail to admin@ascent-chem.com.

    We will respond to you as soon as possible.

    Tel: +8615365186327

    Email: admin@ascent-chem.com

    Inquiry

    Get Free Quote of Ascent Petrochem Holdings Co., Limited

    Flexible payment, competitive price, premium service - Inquire now!

    Certification & Compliance
    More Introduction

    BASF Irganox 1010 Electronic/EL Grade is a pentaerythritol tetrakis(3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionate) radical scavenger identified by CAS 6683-19-8, molecular formula C73H108O12, and molecular weight 1177.63 g/mol. The Electronic/EL designation does not alter the active hindered phenol structure; it denotes a controlled-purity supply form intended for electronic polymer films, epoxy molding compounds, dry film resists, liquid photoimageable solder masks, and underfill formulations. The material is supplied as a white to off-white free-flowing powder or low-dust granules with bulk density generally in the range of 530–630 g/L. Typical release specifications include assay by HPLC ≥98.0 %, melting range by ASTM E794-06(2018) of 110–125 °C, ash ≤0.1 % by ISO 3451-1:2019, and water content ≤0.5 % by ISO 15512:2016. Solubility in water is below 0.01 g/100 g at 20 °C; acetone, chloroform, and ethyl acetate solubilities fall between approximately 46 g/100 g and 71 g/100 g at the same temperature. The product functions as a primary antioxidant that terminates peroxy radicals before β-scission and carbonyl accumulation degrade dielectric properties or cause yellowing at solder reflow temperatures. In high-purity electronic applications, the Electronic/EL grade is selected when incoming raw material must not add measurable chloride, sodium, or transition-metal background to the formulated resin system.

    What differentiates the Electronic/EL grade from standard Irganox 1010 in high-purity polymer systems?

    The principal differentiation is not chemical identity but the ionic residue, trace metal, and particulate boundary. Standard technical Irganox 1010 may be supplied without certified chloride, sodium, iron, or particle-count data because those parameters do not affect ordinary thermoplastics. The Electronic/EL grade is subjected to additional purification, filtration, or recrystallization, and is packaged under conditions intended to reduce extractable ions that can compromise surface insulation resistance or promote electrochemical migration. Table 1 summarizes representative electronic-grade procurement targets; individual certificates of analysis must be obtained for each lot because supplier-specific limits vary.

    Representative specification targets: standard technical grade versus Electronic/EL grade
    ParameterTest methodStandard technical gradeElectronic/EL grade target
    AssayHPLC≥98.0 %≥98.0 %
    Melting rangeASTM E794-06(2018)110–125 °C110–125 °C
    AshISO 3451-1:2019≤0.1 %≤0.05 %
    Water contentISO 15512:2016≤0.5 %≤0.5 %
    ChlorideIon chromatographynot routinely certified≤50 mg/kg
    SodiumICP-MSnot routinely certified≤10 mg/kg
    IronICP-MSnot routinely certified≤10 mg/kg
    Particle count ≥25 μmOptical particle counternot specified≤500 particles/g

    The values in Table 1 are common electronic-grade procurement targets and are not represented as the certified limits on every BASF certificate of analysis. Users qualifying this antioxidant for semiconductor packaging should request batch-specific data covering the process node’s extractable ion budget and particle tolerance. Compared with lower-molecular-weight hindered phenols such as butylated hydroxytoluene or octadecyl-3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionate, Irganox 1010 has a molecular weight of 1177.63 g/mol and four phenolic sites per molecule. BHT melts near 70 °C and can outgas during vacuum lamination or solder reflow. Octadecyl-3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionate has molecular weight 531 g/mol and a melting range near 50–55 °C; it is more mobile in nonpolar matrices but provides lower thermal persistence. Irganox 1010 therefore offers lower migration and higher radical-scavenging equivalents per unit mass in high-temperature electronic processing.

    Thermal oxidative stabilization in epoxy molding compound and dry film resist matrices

    Epoxy molding compounds used for semiconductor encapsulation are commonly cured at 175 °C and post-mold cured at 175–180 °C for 4–6 h. These conditions generate oxidative discoloration and chain scission unless a hindered phenol is present. In cresol novolac epoxy formulations, Irganox 1010 Electronic/EL Grade is typically incorporated at 0.05–0.5 phr before filler addition. The four hindered phenolic sites donate hydrogen to peroxy radicals; the resulting phenoxy radical is stabilized by the adjacent tert-butyl substituents. This retards the autocatalytic oxidation cycle that would otherwise increase carbonyl index in the cured network and reduce hot-wire insulation resistance. Oxidation induction time is measured by ASTM D3895-19 as a comparative lot-acceptance tool, but the measured OIT depends on resin composition, cure state, pan atmosphere, and additive loading. Published OIT values for fully compounded epoxy molding compounds are formulation-specific and cannot be transferred across resin systems.

    In dry film photoresist layers, the same additive suppresses oxidative crosslinking during storage at 23–30 °C. The phenolic antioxidant absorbs UV in the 300–365 nm range. Excessive loading can reduce photoacid generation and alter contrast curves. Formulators generally establish the upper limit by measuring photospeed on a step wedge or by contrast-curve evaluation rather than by antioxidant specification alone. Published data for this specific configuration is limited because resist photoacid generator type, film thickness, and exposure wavelength dominate the response.

    Production-scale compounding of the Electronic/EL grade in a co-rotating twin-screw extruder with L/D ratio ≥40 is usually conducted by side-feeding after the first melt seal. The melting range of 110–125 °C straddles barrel set points used for epoxy resin and polyolefin compounds. If the powder is dry-blended into the main feed throat, low-melting material can coat the first kneading block, reduce specific energy input, and generate unmelted white specks at the pelletizer. Side-feed addition at 90–110 °C barrel temperature reduces this failure mode and improves dispersion homogeneity. For liquid systems, dissolution in acetone or ethyl acetate is straightforward at 20–40 °C; cold storage below 15 °C may lead to crystal nucleation if the concentration approaches the solubility limit. Opened containers should be sealed under nitrogen and stored below 35 °C to minimize water uptake and caking.

    When photoresist and electronic adhesive formulators require low-sodium antioxidant delivery

    This specification is selected when the final assembly must survive biased humidity aging, surface insulation resistance testing, or electrochemical migration screening. Ionic contamination in antioxidant powder can dissolve in resist solvents and deposit at the dielectric interface. Chloride and sodium are particularly mobile under DC bias and can support dendritic growth. The Electronic/EL grade is screened by ion chromatography and inductively coupled plasma mass spectrometry. Acceptance criteria are process-specific: printed circuit board fabricators commonly apply IPC-TM-650 method 2.3.25 to measure ionic cleanliness in μg/cm² sodium chloride equivalent, while semiconductor packaging suppliers may use the same method or an internal extraction protocol tied to wire-bond pad yield and HAST performance. If the antioxidant contributes below 1.56 μg/cm² NaCl equivalent to a bare board extract, it is generally considered compatible with common IPC cleanliness expectations; however, final acceptance must be verified with the formulated product because resin, hardener, and filler residues also contribute.

    The material is not a flame retardant. UL 94 ratings require separate flame-retardant additives such as brominated epoxy, metal hydroxides, or phosphorus-based systems. The Electronic/EL grade is not a coupling agent; silane or titanate adhesion promoters must be added separately where interfacial adhesion is required. In epoxy systems cured with strongly basic or amine-rich hardeners, hindered phenols can undergo transformation to colored quinone methides under prolonged hot air aging. This can increase Gardner color and reduce optical clarity. At addition levels above 0.5 wt% in ultraviolet-cured systems, the antioxidant can compete with photoinitiator absorption in the 365–405 nm range and reduce cure speed. This effect is particularly relevant in cationic epoxy resists where the photoacid generator requires efficient UV absorption. Users should measure the minimum exposure energy to clear a 25 μm film on a step wedge and compare to control formulations without antioxidant. Published data for this specific configuration is limited; the threshold is dependent on photoacid generator type and loading.

    Incoming quality control for Electronic/EL grade shipments should be conducted under low-humidity conditions using a stainless steel thief. Ambient exposure at relative humidity above 60 % can increase water content and promote caking. If powder lumps are observed, drying at 40–50 °C under vacuum or nitrogen is preferred; mechanical grinding should be avoided because it can introduce metal fines and broaden particle size distribution. The product as supplied is not intentionally doped with substances listed in Annex II of Directive 2011/65/EU above homogeneous material limits, and no substance of very high concern under Regulation (EC) No 1907/2006 Article 33 is expected above 0.1 % w/w based on the active molecule. Users must still verify the final formulated article because other components can introduce restricted substances.

    Top