| HS Code | 710872 |
| Chemical Name | Benzocyclobutene (BCB) |
| Synonym | Bicyclo[4.2.0]octa-1,3,5-triene |
| Cas Number | 4026-23-7 |
| Molecular Formula | C8H8 |
| Molecular Weight | 104.15 g/mol |
| Appearance | Colorless to pale yellow liquid |
| Purity | 98% typical |
| Density | 0.957 g/cm3 at 25°C |
| Melting Point | -53°C |
| Boiling Point | 150°C at 760 mmHg |
| Flash Point | 30°C closed cup |
| Solubility | Soluble in common organic solvents; insoluble in water |
| Polymerization Mechanism | Thermally induced ring-opening polymerization via o-quinodimethane intermediate |
| Cure Temperature | 200-250°C |
| Storage Condition | Refrigerate at 2-8°C, protect from light and oxidative conditions |
As an accredited BCB Monomer / Precursor for Polymer Synthesis factory, we enforce strict quality protocols—every batch undergoes rigorous testing to ensure consistent efficacy and safety standards.
| Packing | 25 g in amber glass bottle, sealed under nitrogen with PTFE-lined cap, ready for polymer synthesis. |
| Container Loading (20′ FCL) | BCB monomer precursor for polymer synthesis is packed securely in a 20-foot FCL container, ensuring safe, efficient transport. |
| Shipping | This chemical is shipped in airtight, moisture-proof containers to preserve reactivity. Standard ambient temperature transport is acceptable; however, avoid extreme heat and direct sunlight. Ensure proper labeling as a hazardous material if applicable. Handle with personal protective equipment to prevent skin and eye contact during unpacking. |
| Storage | Store BCB monomer in a tightly sealed container under inert gas (e.g., nitrogen or argon) in a cool, dry, dark place. Keep away from light, moisture, and oxygen to prevent premature polymerization. Do not expose to heat or ignition sources, and ensure proper ventilation in the storage area. |
| Shelf Life | Store at -20°C under inert gas, protected from light and moisture; shelf life typically 6 months. |
Within redistribution-layer processing for wafer-level packaging, benzocyclobutene monomer is converted into divinylsiloxane-bis-benzocyclobutene (DVS-BCB) thermoset and used as a spin-on interlayer dielectric and passivation film. The ring-opening of 1,2-dihydrobenzocyclobutene proceeds through a conrotatory electrocyclic mechanism to an ortho-quinodimethane intermediate; subsequent Diels-Alder oligomerization and crosslinking release no volatile by-products, permitting cure in confined cavities without voiding. On 300-mm spin tracks, a formulation addition ratio of 46 wt% DVS-BCB solids in mesitylene is dispensed onto hexamethyldisilazane-primed silicon wafers and spun at 1,500–4,000 rpm to produce dried films from 2.5 µm to 15 µm. Soft bake at 100 °C for 120 s removes residual solvent; final cure is performed at 250 °C for 60 min in a nitrogen-purge oven with oxygen concentration maintained below 50 ppm because oxidation above 200 °C causes darkening and increased dielectric loss. Edge bead removal uses mesitylene in the coater cup; incomplete edge bead removal has been observed on production lines to generate particles during cure. Film thickness non-uniformity is controlled to within ±3% across 300-mm wafers; batch-to-batch viscosity variation of ±10% requires spin-speed adjustment. Single-coat films above 15 µm have shown cracking due to coefficient of thermal expansion mismatch between silicon and cured BCB; two-coat processing with an intermediate soft bake is used to reduce residual stress. Amine-based adhesion promoters are not used because residual amines interfere with dark reaction control in subsequent lithography. Compliance for this layer is assessed by ASTM D150-22 for dielectric constant at 1 MHz, ASTM D257-14 for volume resistivity, UL 94 V-0 for flammability after cure, and MIL-STD-883 Method 5011 for adhesion following thermal cycling. Cured film typically exhibits a dielectric constant of 2.65, dissipation factor below 0.001, volume resistivity above 1 × 10^19 Ω·cm, and moisture absorption below 0.25 wt% after 24 h at 85 °C/85% RH. Terminal product types include copper redistribution-layer dielectrics, final passivation over aluminum pads, stress-buffer layers under solder bumps, and chip-to-wafer bonding interfaces in high-density fan-out packages.
| Property | Test method | Acceptance threshold |
|---|---|---|
| Dielectric constant at 1 MHz | ASTM D150-22 | ≤ 2.70 |
| Dissipation factor at 1 MHz | ASTM D150-22 | ≤ 0.001 |
| Volume resistivity | ASTM D257-14 | ≥ 1 × 10^19 Ω·cm |
| Dielectric strength | ASTM D149-20 | ≥ 3.5 MV/cm |
| Moisture absorption | ASTM D570-22 | ≤ 0.25 wt% after 24 h at 85 °C/85% RH |
| Flammability | UL 94 | V-0 |
Photo-BCB formulations are typically supplied at 40 wt% solids in 1,3,5-trimethylbenzene with the photoactive component pre-dissolved by the manufacturer; separate addition of photoinitiator is not recommended because off-ratio mixing accelerates dark reaction and lowers shelf life below the specified 12 months at 0–5 °C. In lithography cells operating at ISO 14644-1 Class 5 or better, the formulation is spin-coated at 2,000–3,500 rpm to form 5–12 µm films and soft baked at 100 °C for 120 s. Exposure is carried out with 365 nm i-line steppers at 100–300 mJ/cm², followed by post-exposure bake at 60–90 °C for 10–20 min to complete crosslinking in exposed areas. Development in Stoddard solvent or mesitylene-based developer removes unexposed material, producing via openings and trenches with sidewall angles of 60–80° without amine contamination. The principal process conflict is dark reaction in unexposed regions, which reduces contrast and increases residue after development; this is controlled by holding developer temperature at 23 ± 2 °C and limiting post-exposure delay to under 30 min. Production-scale exposure tools have demonstrated residue from edge bead reflow when wafer edge airflow is not balanced. Compliance includes REACH registration for mesitylene, RoHS 2011/65/EU for final packaging, SEMI S7 for wafer-fab safety, and ASTM D3359-17 for cross-cut adhesion. Terminal product types include patterned redistribution-layer dielectrics, bump pad openings, plasma etch masks, and microfluidic channels in lab-on-chip devices.
A 200-mm wafer bonder configured with 1.0 µm bondline thickness control and 2,500 N bonding force is used to join cap wafers to device wafers after spin-coating a DVS-BCB adhesive formulation at 50–60 wt% solids in mesitylene. The higher molecular weight oligomer used for bonding yields a spin-film viscosity of 1,000–3,000 cSt, allowing 2–5 µm bondlines after vacuum lamination. Pre-cure at 150 °C for 30 min removes solvents without initiating premature ring-opening; the bond is then completed at 250 °C for 60 min under 1 × 10⁻³ mbar vacuum and 2–5 kN force to squeeze excess resin into dedicated moat structures. Post-bond inspection uses scanning acoustic microscopy for void detection; acceptance criteria typically reject void area above 5% of bond ring width. Compliance for hermetic MEMS packaging references ASTM E595-15 for outgassing with total mass loss below 1.00% and collected volatile condensable material below 0.10%, MIL-STD-883 Method 2009 for helium leak rate, and ISO 14644-1 for cleanroom particulate control. Terminal product types include pressure sensors, accelerometers, RF MEMS switches, microbolometers, and wafer-level capping layers for thin-film vacuum packaging.
For arrayed waveguide gratings fabricated on 200-mm silicon substrates, DVS-BCB monomer is diluted to 30–40 wt% solids in mesitylene to produce slab waveguides with controlled thickness from 2.0 µm to 8.0 µm. The core layer is cured at 250 °C under nitrogen, then patterned by reactive ion etching using an oxygen/CF4 plasma chemistry; the cladding layer is spin-coated from the same monomer system and cured to produce a refractive index step of 0.001–0.003 at 1550 nm. Optical compliance is assessed by Telcordia GR-1209-CORE for passive component reliability, IEC 61300-2-22 for damp heat, and ASTM E595-15 for outgassing in sealed optoelectronic packages. Published data for insertion loss below 0.2 dB/cm in fully etched BCB channel waveguides is limited; design values of 0.5–0.8 dB/cm at 1550 nm are the supported baseline. Terminal product types include arrayed waveguide gratings, planar lightwave circuits, silicon photonic interposers, and waveguide-based evanescent sensors.
High-density packaging substrates with 5 µm line/space geometries use BCB monomer spin-coated at 40–55 wt% solids in mesitylene to produce 5–20 µm interlayer dielectrics between copper traces in high-frequency packages. The cured film’s dielectric constant of 2.65 at 10 GHz and dissipation factor below 0.001 support 28 GHz and 60 GHz antenna-in-package designs; compliance is verified by IPC-TM-650 2.5.5.9 for permittivity and loss tangent at 10 GHz, IPC-TM-650 2.5.17 for dielectric strength, and UL 94 V-0 for flammability. Laser drilling with UV picosecond systems forms 20–50 µm vias through the cured BCB layer; fluence must remain below 1.5 J/cm² to avoid carbonized via sidewalls. Seed copper is then deposited and patterned by semi-additive processing. Terminal product types include antenna-in-package substrates, mmWave phased-array modules, and flip-chip ball grid array substrates.
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Benzocyclobutene-functional precursor, supplied commercially as divinylsiloxane-bis-benzocyclobutene (DVS-BCB), is a low-molecular-weight thermosetting monomer used in redistribution layers, passivation films, wafer bonding, and planarizing coatings where cured-film dielectric constant, moisture uptake, and solvent-patternability must be controlled simultaneously. The structure contains two benzocyclobutene end groups joined by a siloxane-containing core; thermal ring-opening above 200°C generates an o-quinodimethane intermediate that reacts by Diels-Alder addition without added catalyst and without condensation byproducts. Electronic-grade solutions in mesitylene are supplied at 34.5–36.5 wt% solids for sub-2 µm films, at 45.0–47.0 wt% solids for 2–10 µm films, and at higher solids for bond-line applications. Solventless monomer is a clear to pale yellow viscous oil or low-melting solid depending on storage history; certificates of analysis typically list GC assay not less than 98.0%, water content below 100 ppm by Karl Fischer titration according to ASTM E203, and 4-tert-butylcatechol inhibitor in the 100–300 ppm range. Viscosity is measured at 25°C under ASTM D4287 or ISO 2884-1. Model 3022-35 is used for thin spin-on films, model 3022-46 for medium-thickness dielectrics, and model 3022-57 for thick bond lines and high-topography planarization.
Representative solution-grade parameters are summarized in Table 1. Exact certificate-of-analysis values vary by lot and supplier.
| Grade | Nonvolatile content | Viscosity at 25°C | Typical use |
|---|---|---|---|
| 3022-35 | 34.5–36.5 wt% | 1.9–2.5 cSt | sub-2 µm passivation and thin redistribution films |
| 3022-46 | 45.0–47.0 wt% | 48–60 cSt | 2–10 µm redistribution dielectrics |
| 3022-57 | 55.0–59.0 wt% | 1000–8000 cSt | thick bond lines and high-topography coatings |
The cure reaction proceeds through ring-opening of the cyclobutene moiety to an o-quinodimethane, which can undergo Diels-Alder homopolymerization and react with vinyl or alkene groups present in the formulation. Differential scanning calorimetry at 10°C/min under nitrogen typically shows an exotherm onset between 170°C and 220°C with a peak between 240°C and 260°C; isothermal cure in a convection oven or belt furnace is normally conducted at 200–250°C for 60–120 min for film thicknesses up to 10 µm. Oxygen concentration in the cure atmosphere is maintained below 50 ppm when copper or other oxidation-sensitive metals are present. Because no water or low-molecular-weight leaving group is generated, the cured network exhibits low volumetric shrinkage and does not require vented lamination. The low initial viscosity of the solvent-borne solutions permits spin coating onto high-topography redistribution layers; after solvent removal, the precursor retains sufficient flow before gelation to planarize 1–5 µm features, but the processing window narrows when the hot-plate temperature exceeds 150°C because mesitylene evaporates too quickly and film thickness uniformity degrades on 200 mm and 300 mm substrates.
The process conflict between solvent removal and gelation constitutes the main production window. Mesitylene boils at 164–165°C, but the DVS-BCB ring-opening onset lies close to 170–220°C. If a soft bake is run above 150°C to remove residual solvent quickly, localized gelation can occur before the solvent has fully escaped, producing blisters or frozen surface roughness. If the soft bake is too short, residual mesitylene volatilizes during the final cure and increases void density. A two-step soft bake at 100°C for 2 min followed by 140°C for 1 min is commonly used for 46 wt% solids films; the upper step remains below the threshold where gelation rate becomes significant. Thermogravimetric analysis of a 46 wt% solution typically shows two distinct mass-loss steps: solvent evaporation between 100°C and 160°C, and cured-network degradation above 400°C in nitrogen.
Rheological characterization on a parallel-plate rheometer at 10 rad/s shows that the 3022-46 solution is nearly Newtonian at room temperature with complex viscosity near 50 cP. During heating from 25°C to 150°C, viscosity drops by roughly one order of magnitude due to thermal thinning and solvent loss, then rises sharply after 170°C as ring-opening oligomerization advances. The gel point is observed in dynamic time sweeps as the crossover of storage modulus G′ and loss modulus G″; its exact time depends on film thickness and heating rate, but in a 250°C isothermal sweep it often occurs within 10–20 min for a neat monomer film. This rheological transition defines the maximum pre-bake temperature before contact aligner exposure and the minimum hot-plate temperature for pattern stabilization.
Production-scale batch-to-batch variance is most often observed as a shift in viscosity or solids content rather than reaction onset. A variation of ±0.5 wt% solids can alter spin-coated thickness by approximately 0.15–0.25 µm on a 200 mm wafer using a 1,500 rpm spin speed; therefore, resist or dielectric tracks typically include automated viscosity compensation or pre-dilution with mesitylene. The cured film is resistant to strong acids, bases, and common solvents; the crosslinked aromatic network is insoluble in all common solvents, which is a documented difference from thermoplastic precursors.
For wafer-level redistribution and passivation films, the DVS-BCB precursor is filtered through 0.2 µm PTFE and spin-coated onto an organosilane adhesion promoter. A soft bake at 100–150°C for 2–5 min removes the mesitylene carrier; final cure at 200–250°C is performed in a nitrogen-purged oven with ±2°C temperature uniformity across the wafer carrier. Representative cured-film properties in supplier literature include dielectric constant of 2.65 at 1 MHz with dissipation factor of 0.0008 according to ASTM D150-18, volume resistivity of 1×1019 Ω·cm according to ASTM D257-14, dielectric strength of 5.3 MV/cm according to ASTM D149-20, water absorption below 0.2% according to ASTM D570-98, and tensile modulus near 2.9 GPa with elongation near 8% according to ASTM D638-14. These values are formulation-specific; thin films cured above 250°C or exposed to oxygen plasma can exhibit higher dielectric loss.
Because the basic electronic grades are not photosensitive, patterning is accomplished by dry etching through a patterned photoresist. In a reactive ion etcher with 13.56 MHz RF excitation and O2/CF4 chemistry, etch rate and profile are sensitive to chamber pressure and bias power; standard practice uses a low-pressure 50–100 mTorr process to maintain anisotropic sidewalls. The cured BCB surface is resistant to many solvent strippers, so photoresist rework after cure is limited and often requires plasma ashing. This is a significant operational difference from solvent-strippable epoxy or polyimide precursors.
In wafer bonding, the higher-solids grade is dispensed onto a cap wafer after pre-bake and then contacted under 0.5–2 bar in a wafer bonder; the bond line thickness is controlled by spin speed and solvent content. The absence of condensation water permits void-free bond lines with thickness below 10 µm when pre-bond degassing is performed at 60–80°C under 25 Torr for 30 min. Adhesion to copper and aluminum is improved with a dilute organosilane adhesion promoter; without such a promoter, wetting and adhesion on sputtered copper can vary across the wafer edge and center. Published data for this specific configuration is limited, and bond-line adhesion should be verified with wafer shear or stud-pull testing according to the end-user qualification plan.
A direct substitution is generally process-limited by cure temperature, storage life, and etch or clean chemistry rather than by a single electrical property. BCB monomer cures at 200–250°C, which is below the typical 350–400°C imidization range of aromatic polyimides but above the 150–180°C cure used for many electronic epoxies. Unlike epoxy, BCB does not require a stoichiometric hardener; unlike polyimide, it does not release water during cure. Compared with bismaleimide, cured BCB exhibits lower dielectric constant and moisture absorption, while bismaleimide may offer higher crosslink density and service temperature. Table 2 summarizes representative values from supplier technical data and standard test methods.
| Property | BCB cured film | Epoxy | Polyimide | Test method |
|---|---|---|---|---|
| Dielectric constant at 1 MHz | 2.65 | 3.9–4.5 | 3.2–3.5 | ASTM D150-18 |
| Dissipation factor at 1 MHz | 0.0008 | 0.02–0.03 | 0.002–0.01 | ASTM D150-18 |
| Water absorption | <0.2% | 0.5–2.0% | 1.5–3.0% | ASTM D570-98 |
| Volume resistivity | 1×1019 Ω·cm | 1×1014–1×1016 Ω·cm | 1×1016–1×1017 Ω·cm | ASTM D257-14 |
| Typical cure temperature | 200–250°C | 150–180°C | 350–400°C | DSC |
When a container is removed from cold storage, it is warmed to 20–25°C in a dry nitrogen glovebox or desiccator before opening. Condensation from ambient air above 60% RH introduces moisture into the solventless monomer and can generate microvoids during cure; pre-drying under vacuum at 60°C for 30 min may be applied to low-solids formulations, but the inhibitor and low molecular weight of the precursor make prolonged heating above 100°C unsuitable because it advances oligomerization. Electronic-grade material is specified with low total chloride and sodium, typically below 1 ppm each, to preserve dielectric loss and corrosion resistance in contact with aluminum traces. Amine-containing cleaning agents and epoxy hardeners should not be allowed to contaminate coater bowls or dispensing syringes because residual amines can neutralize acidic adhesion promoters or modify the substrate surface; for BCB itself, the primary chemical incompatibility is with strong oxidizing agents that attack the siloxane backbone.
In microfluidic and millimeter-wave packaging trials, the choice between 3022-35 and 3022-46 is dictated by target film thickness and spin-speed latitude. On a 150 mm wafer track, 3022-35 gives films below 1 µm at 2,000 rpm, while 3022-46 gives 2.5–5 µm films across the same speed range. The cured films maintain low water absorption, but prolonged service in air above 300°C leads to oxidative degradation and an increase in dielectric loss; this is a documented operational boundary rather than a short-term processing failure.